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Library

The library contains Application Notes, Technical Notes and Literature searchable by type and division. Use the form below to search the library content.

Newsletters

  • Wholly Hitachi - HTA CAC Newsletter - 2nd Quarter 2012
  • Wholly Hitachi - HTA CAC Newsletter - 4th Quarter 2012
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News

  • Jul 30, 2015
    Real-time 3D Analytical FIB-SEM Composite Instrument NX9000 Released
  • Mar 5, 2015
    Hitachi High-Technologies Corporation Receives Intel's Prestigious Supplier Continuous Quality Improvement Award
  • Oct 21, 2014
    The First Hitachi High Technologies America Electron Microscopy Annual Fellowship for Clemson University Awarded
  • Oct 1, 2014
    New Scanning Electron Microscope: SU5000 – Awarded Good Design that is an annual program for commendation of design by Japan Institute of Design promotion (JDP)
  • Aug 4, 2014
    New Tabletop Microscope: TM3030Plus -- Offers real-time Secondary Electron Imaging without Sample Preparation
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