Atomic Force Microscopes

From surface topography to a wide variety of nanoscale surface property measurements, Hitachi’s new portfolio of innovative scanning probe microscopy (SPM) products offer extraordinary levels of performance, value, and ease-of-use. In 2013, Hitachi High-Technologies Corporation acquired Hitachi High-Tech Science Corporation (HHS) and their well-established SPM product line. The latest models, the AFM5100N and the AFM5300E, represent the culmination of 30 years’ experience developing and producing STM/AFM and related analytical instrumentation.