SU3500 Premium VP-SEM

Hitachi Scanning Electron Microscope | SU3500 Premium VP-SEM
The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance -- sure to be the workhorse in any laboratory.

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Overview
The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.
 
  • Unparalleled Image Quality—All new electron optics design with best-in-class image sharpness
  • Intuitive Operation—Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology
  • Ultra Variable-Pressure Detector—Image surface information at low vacuum and low accelerating voltages
  • Stereoscopic Image Function—Point and click for seamless, real-time "3D"  image observation

The electron optics design yields unmatched imaging performance achieving high resolution at low accelerating voltage.
Accelerating Voltage: 3kV, Secondary Electron (SE) Image | Magnification: x40,000, Resolution:7nm
Accelerating Voltage: 5kV, Backscattered Electron (BSE) Image | Magnification: x30,000, Resolution:10nm

Unique live signals can be mixed and displayed as a combined live image.