Transmission Electron Microscopes

HTA offers a broad range of transmission electron microscopes (TEM) and scanning transmission electron microscopes (STEM). The 120 kV, 200 kV, and 300 kV field-emission gun (FEG) or thermionic emission gun (LaB6 or W) electron microscopes provide fundamental functions such as atomic resolution imaging, electron diffraction, HAADF-STEM imaging, secondary electron imaging, electron holography, 3-D electron tomography, cryomicroscopy, EDS and EELS for structural and chemical characterizations of nanomaterials, semiconductors, energy technology, polymers, glassy materials, biomolecular mechanisms of disease, 3D-architecture of cells and tissues, viruses and macromolecular complexes. Cs-corrected STEM (probe corrector) made sub-angstrom resolution imaging achievable. Hitachi in-situ TEM enables real-time atomic-resolution observation of materials under external stimuli.