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Electron, Ion, and Probe Microscopy

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News

Jul 30, 2015
Real-time 3D Analytical FIB-SEM Composite Instrument NX9000 Released
Mar 5, 2015
Hitachi High-Technologies Corporation Receives Intel's Prestigious Supplier Continuous Quality Improvement Award
Oct 21, 2014
The First Hitachi High Technologies America Electron Microscopy Annual Fellowship for Clemson University Awarded
Oct 1, 2014
New Scanning Electron Microscope: SU5000 – Awarded Good Design that is an annual program for commendation of design by Japan Institute of Design promotion (JDP)
Aug 4, 2014
New Tabletop Microscope: TM3030Plus -- Offers real-time Secondary Electron Imaging without Sample Preparation

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