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News

  • Jul 30, 2015
    Real-time 3D Analytical FIB-SEM Composite Instrument NX9000 Released
  • Mar 5, 2015
    Hitachi High-Technologies Corporation Receives Intel's Prestigious Supplier Continuous Quality Improvement Award
  • Oct 21, 2014
    The First Hitachi High Technologies America Electron Microscopy Annual Fellowship for Clemson University Awarded
  • Oct 1, 2014
    New Scanning Electron Microscope: SU5000 – Awarded Good Design that is an annual program for commendation of design by Japan Institute of Design promotion (JDP)
  • Aug 4, 2014
    New Tabletop Microscope: TM3030Plus -- Offers real-time Secondary Electron Imaging without Sample Preparation
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